3D X-ray microscopy (XRM)

The ZBT offers state-of-the-art technologies for material analysis, including the ZEISS Xradia 620 Versa 3D X-ray microscope. This innovative technology enables materials to be examined in three dimensions and reveals detailed structures that are often inaccessible using conventional methods.

 

Thanks to high-resolution X-ray images, even the smallest details, such as internal defects and structural parameters, can be analysed with precision. Our XRM system is suitable for both research and industrial applications where accurate material analysis is required.

3D-Röntgenmikroskop am ZBT

Technical specifications:

  • Maximum resolution: up to 0.5 µm
  • Power: 25 W
  • Voltage range: 30 – 160 kV
  • Available lenses: 0.4x, 4x, 20x, 40x
  • Maximum sample weight: 25 kg
  • In-situ measurements possible

Measuring principle

  • Radiography: X-ray transmission of the sample is converted into visible light and projected onto a CCD camera.

  • Tomography: Radiographs are taken from different rotation angles to calculate a 3D structure.

  • Software: Data analysis with statistical methods, segmentation or machine learning algorithms.

3D X-ray microscope

Simon Dondrup
+49 203 7598-2364
Porträt von Simon Dondrup.